Cereal Chem. 73 (3):323-327 |
Analytical Techniques and Instrumentation
Image Analysis of Whole Grains to Screen for Flour-Milling Yield in Wheat Breeding.
M. Berman (1), M. L. Bason (2,3), F. Ellison (4), G. Peden (1), and C. W. Wrigley (2). (1) CSIRO Division of Mathematics and Statistics, Macquarie University, NSW 2113, Australia. (2) CSIRO Division of Plant Industry, North Ryde, NSW 2113, Australia. (3) Newport Scientific, Warriewood, NSW 2102, Australia. (4) University of Sydney Plant Breeding Institute, Narrabri, NSW 2390, Australia. Accepted February 20, 1996. Copyright 1996 by the American Association of Cereal Chemists, Inc.
Image analysis of whole-grain samples was used to predict milling quality in wheat breeding to select for this aspect of quality, while preserving the seed intact for sowing. About 66% of the variation in flour yield for 38 grain samples could be explained by four factors computed from the images of 100 grains for each sample (mean of grain area, lengths of minor and major axes, and ellipsoidal volume), plus test weight. Test weight alone accounted for only 17% of the variation. The set of grain samples consisted of eight genotypes (three cultivars and five breeders' lines) grown at up to six sites. The method devised is suitable for a breeding program, being relatively low in labor requirement, not requiring time consuming positioning of the grains, and having low cost (less than $3,000 plus personal computer and software). The results of this preliminary study should provide direction for further development of noninvasive analysis of milling quality.